An Effective and Convenient Solution for Sample Testing - A 4-inch Manual Probe Station

In the field of chip testing, a 4-inch manual probe station plays a crucial role. It not only provides a stable and reliable test environment, but also accurately detects the performance and function of the chip. This article details the important applications and advantages of 4-inch manual probe stage in chip testing.

The 4-inch manual probe stage is a device for testing chips and is suitable for chips in various package types, such as BGA, QFN, LGA and so on. It has a precise structure and stable performance, which can provide high-precision inspection and test results. test probe also has a variety of interfaces that can be directly connected to test equipment and computers for easy data transmission and analysis.

The 4-inch manual probe table has a wide range of applications in chip system testing. It can be used for the front-end test of the chip, and can carry out a more comprehensive test and analysis of the chip's input and data output ports, power consumption, clock frequency and so on. In addition, it can also be directly used for chip performance verification and validation, through the chip using different social functions of the main module of the test, to determine whether the chip enterprise has reached the teaching design requirements and expected performance.

This 4-inch manual probe meter can also be used for chip reliability testing. Reliability is an important index for evaluating the quality of the chip, which is directly related to the stability of the chip in different environments and conditions. The reliability and stability of the chip can be evaluated by repeated cycle testing on the 4-inch manual probe table, providing an important reference for chip manufacturers.

The 4-inch manual probe stage is also highly flexible and expandable. It can be customized according to the different test requirements of the chip,micromanipulator including the number and position of the probes, the setting of test parameters and so on. It also supports a variety of test modes such as standing wave test, time domain test, spectrum test, etc., which can meet the requirements of different chip tests.